-
AEAPDES Composite InsulatorFilm CHRYSALIS_INC FM_KPFM Polydimethylsiloxane Cancer KevlarFiber nanomechanical LithiumNiobate hetero_structure ElectrostaticForceMicroscopy NanoLithography Oxidation AmplitudeModulation Silver Indium_tin_oxide Tape Alkane Foil Singapore Molybdenum LiftHeight Boundary Ananth Insulator Wildtype Chemical Vapor Deposition HexagonalBoronNitride OpticalWaveguide PVA Holes hard_disk_media LaAlO3 BismuthVanadate
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Polycrystalline ferroelectric BCZT
Scanning Conditions
- System: NX12
- Scan Mode: PFM
- Cantilever: ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.4Hz
- Pixel: 256×256
- Sample bias sweep range for Piezoresponse curve: -10V ~ +10V