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Polymer Sadowski Oxidation temperature controller AFM silicon_carbide IVSpectroscopy Tungsten BlockCopolymer Optoelectonics Worcester_Polytechnic_Institute oxide_layer TemperatureControllerStage Defects Hexacontane TyphimuriumBiofilm OxideLayer FAFailureAnlaysis SmalScan Insulator FAPbI3 Kevlar University_of_Regensburg BiasMode FrequencyModulation SFAs nanomechanical GalliumPhosphide TemperatureControl Inorganic_Compound C60H122 SrTiO3 Neodymium BiVO4 LightEmiting SThM
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Crystal
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: NCHR
- Scan Size: 2μm×2μm
- Scan Rate: 0.7Hz
- Pixel: 256 × 256
- Scan Mode: Non-contact
- Cantilever: NCHR
- Scan Size: 2μm×2μm
- Scan Rate: 0.7Hz
- Pixel: 256 × 256