| Contact Us   Global
Park AFM Modes and Techniques

Park AFM Modes and Techniques

Get the data you need with Park's selection of scanning modes

Park AFMs feature a comprehensive range of scanning modes so you can collect a wide array of data types accurately and efficiently. From the world’s only true non-contact mode that preserves tip sharpness and sample integrity to advanced Magnetic Force Microscopy, Park offers the most innovative, accurate modes in the AFM industry.

imaging-mode

Imaging Modes

Park offers some of the most innovative imaging modes and technology. Our True Non-Contact mode is the world’s only truly non-contact AFM scanning mode while our standard scanning mode is among the most accurate available.


electrical-characterization-mode

mechanical-characterization-mode

Nanomechanical Modes

Easily measure the mechanical properties of your sample using our set of mechanical scanning modes. Each features Park System’s trademark accuracy so you always know
you’re collecting data you can rely on.


functional-characterization-mode