Park Systems, the leading nanotechnology solutions partner of nanoscale measurements, will exhibit at the Applied Physics Meeting in Yamagata, Japan from August. 29th to September 1st. Please come and visit our booth to learn our wide range of research AFM products such as award-winning XE-100, which provides artifact-free imaging via Crosstalk Elimination (XE) and offers the ultimate in AFM resolution with True Non-Contact mode. Also, find out more about the XE-150, our premier cross-functional AFM with motorized sample stage, and the XE-Bio, our new AFM for live cell imaging with Ion Conductance Microscopy (ICM). All the XE-series of products feature artifact free imaging by Crosstalk Elimination (XE) and non-destructive scan by True Non-Contact mode.
http://www.jsap.or.jp/english/meeting-events/annualmeeting.html