Imaging Modes

Park offers some of the most innovative imaging modes and technology. Our True Non-Contact mode is the world’s only truly non-contact AFM scanning mode while our standard scanning mode is among the most accurate available.

• True Non-Contact™ Mode
• Contact Mode
• Tapping Mode

Electrical Modes

For engineers and researchers that need accurate data on conductance, sample resistance, and other electrical and topographic properties, Park offers a range of electrical scanning modes.

• PinPoint™ Conductive AFM
• Conductive Probe AFM
• I-V Spectroscopy
• Electrostatic Force Microscopy
• Kelvin Probe Force Microscopy
• Dynamic Contact EFM
• Piezoresponse Force Microscopy

• Piezoresponse Force Spectroscopy
• QuickStep™ SCM
• Scanning Capacitance Microscopy
• Scanning Spreading Resistance Microscopy
• Scanning Tunneling Microscopy
• Photo Current Mapping

Nanomechanical Modes

Easily measure the mechanical properties of your sample using our set of mechanical scanning modes. Each features Park System’s trademark accuracy so you always know
you’re collecting data you can rely on.

• PinPoint™ Nanomechanical Mode
• Force Distance Spectroscopy
• Force Volume Imaging
• Force Modulation Microscopy

• Lateral Force Microscopy
• Nanolithography
• Nanoindentation
• Spring Constant Calibration

Special Modes

Park offers some of the most innovative imaging modes and technology. Our True Non-Contact mode is the world’s only truly non-contact AFM scanning mode while our standard scanning mode is among the most accurate available.

• Scanning Thermal Microscopy
• Magnetic Force Microscopy
• Tunable Magnetic Field MFM
• Chemical Force Microscopy
• Electrochemical Microscopy