Park Systems, the leading nanotechnology solutions partner of nanoscale measurements, will exhibit at the Applied Physics Meeting in Yamagata, Japan from August. 29^th to September 1^st. Please come and visit our booth to learn our wide range of research AFM products such as award-winning XE-100, which provides artifact-free imaging via Crosstalk Elimination (XE) and offers the ultimate in AFM resolution with True Non-Contact mode. Also, find out more about the XE-150, our premier cross-functional AFM with motorized sample stage, and the XE-Bio, our new AFM for live cell imaging with Ion Conductance Microscopy (ICM). All the XE-series of products feature artifact free imaging by Crosstalk Elimination (XE) and non-destructive scan by True Non-Contact mode.

http://www.jsap.or.jp/english/meeting-events/annualmeeting.html