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The leading innovator of nanoscale
microscopy and metrology solutions

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FX40-AFM

Accelerate Your Research

Park FX40
NX-Wafer-AFM

Accurion i4

The ultimate stability and accuracy
solution for your scientific research

NX20-AFM

Park NX20

Accurate Large Sample AFM solution
for research and failure analysis

NX-Mask-AFM

Park NX-Mask

Repair your most challenging
photomask defects

NX-Wafer-AFM

Park NX-Wafer

Industry's leading automated AFM
for in-line metrology solutions

Emerging Trends of Nanotechnology

Read the Park systems' Technical Articles about AFM to understand recent developments

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AFM Experts provides you Online Courses, Webinar, Live Demos and Educational Videos from AFM Experts

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Park Systems aims to support the next generation of Trail Blazers in Nanoscience by encouraging young researchers to share and discuss their research

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 EVENTS

Nano Tech 2014
Jan 29th ~ 31th
Tokyo, Japan

58th Annual Biophysical Society Meeting
Feb 15th ~ 19th
San Francisco, USA

SEMICON China 2014
March 18th ~ 20th
Shanghai, China
 LATEST NEWS
Enabling Nanoscale Advances
 icon Featured Application: PinPoint Conductive AFM
pinpoint-image
PinPoint Conductive AFM was developed for well defined electrical contact between the tip and the sample. The XY scanner stops as the electrical current is acquired with contact time controlled by the user. PinPoint Conductive AFM allows higher spatial resolution, without lateral force, with optimized current measurement over different sample surface. The comparison of conductive AFM images of ZnO nanorods show that while conventional contact conductive AFM may have a higher current measurement than tapping conductive AFM, its resolution is compromised as the tip wears out in contact mode topography. The new PinPoint conductive AFM shows the best of both higher spatial resolution and optimized current measurement. READ MORE
 
icon Featured Product: Park NX20
nx20 img Park NX20, the leading nanometrology tool for failure analysis and large sample research, is equipped with unique features that make it easier to uncover the reasons behind device failure and develop more creative solutions. Its unparalleled precision provides high resolution data that lets you focus on your work, while its True Non-Contact Mode™ scan keeps tips sharp longer, so you won’t have to waste as much time and money replacing them.
READ MORE
icon Park Interview Series: Insights from Industry
park-ceo In this interview, Dr. Sang-il Park, CEO and chairman of Park Systems, talks about his company’s current business position in industry manufacturing, and tells AZoNano about the new product, Park NX20, and its groundbreaking measurement accuracy for failure analysis laboratories. Coming Soon
   
 
New Park AFM
LIVE
Q1 Webinar
pinpointmode
Park AFM Failure Analysis Mode
AFM PinPoint Conductive AFM
Extremely accurate conductive measurement technology at nano-scale resolution for FA in the semiconductor industry
 
Coming Soon
 
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A New Class of Atomic Force Microscope

Park FX40

Repair your most challenging photomask defects

NX-Mask

Thin film characterization imaging ellipsometer nanofilm

Accurion EP4

Compact benchtop isolation table in 3 sizes for versatile use

Accurion EP4

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